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BTX-Compact Benchtop Powder X-Ray Diffractometer

Quantity:
  • BTX II

  • 奥林巴斯

The BTX desktop XRD system is a fast, low-cost, and small-footprint desktop XRD instrument. It can not only distinguish the major components, minor components, and trace components of the material from whole crystal phases, but also A rapid XRF scan of various elements of uranium. The system's minimal sample preparation technology and its unique sample compartment allow operators to use this benchtop instrument to quickly analyze samples. This feature is an advantage over large, costly laboratory equipment.

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BTX desktop X-ray diffraction / X-ray fluorescence analyzer, in short, is an instrument that combines XRD and XRF technology for the purpose of convenience. BTX can be used in a variety of fields from educational environments to stringent quality control applications. BTX is based on the field-proven and reliable TERRA portable field operation XRD / XRF instrument. It has the same operating performance as Terra, but it does not have portable performance. The technology used in the portable rock and mineral analyzer has won the prestigious R & D 100 award and has been selected as the technology to be used on the Mars Science Laboratory "Wanderer" set to sail in 2011. Please find more information on the NASA website.

BTX is a compact powder analysis system that combines XRF and XRD technologies. Now, in an easy-to-use, small-footprint, low-cost instrument, XRD analysis can be done reliably. Thanks to BTX's patented sample processing system, not only the sample preparation time is greatly shortened, but the peak discrimination can also achieve high accuracy. Previously, only large and expensive laboratory systems could be used to achieve this. Level of accuracy.


Key Features / Benefits

• Full-featured instruments

• Sample preparation is very simple

. Loose powder (~ 20 mg sample)

. Sieve samples <150 µm

• Easy to use, single button operation

• True 2D powder XRD instrument

. Provide images of XRD diffraction patterns

. View particle effects or preferred orientation

• Energy-differentiated X-ray detector

. Removes fluorescence, scattering, and other background radiation

. XRF spectrum data for confirmation of diffraction pattern


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